LS 13 320 XR – Laser Diffraction Particle Size AnalyserFrom its dynamic range to its higher resolution, the LS 13320 XR offers specific, quantifiable improvements that benefit both the pharma and industrial markets.
Details matter. Small changes in material can result in big differences in finished product.
Your customers demand consistency and the new LS 13320 XR can help ensure that expectations are always met.
Building on the Beckman Coulter legacy of providing accurate, reproducible results, the LS 13320 XR features an expanded dynamic range and workflow optimised software to better meet the needs of high throughput laboratories.
We made big improvements so you can spot small differences.
The LS 13 320 XR boosts laser diffraction particle size analysis to the next level, with its enhanced PIDS technology and extended measurement range providing higher resolution and more accurate, reproducible results. You can measure a wider range of particles and detect smaller differences in samples more quickly and reliably. And new software with an intuitive interface provides data you need with only a few clicks.
Details that matter
- Expanded measurement range: 10 nm – 3,500 μm
Provides real (not extrapolated) analytical data down to 10 nm, and high-resolution measurements up to 3,500 μm
- Enhanced PIDS technology: Polarisation Intensity Differential Scattering
Enables more precise raw data detection and increased detector sensitivity of vertical and horizontal polarised scattered light for sub-µm particle size analysis – a measurement quality previously unavailable
- Advanced automodality
No knowledge about particle size distribution (e.g., multiple fractions, narrow distribution) needed prior to measurement in order to obtain a correct result
- Optimised, intuitive software
• Requires 2 clicks from Start Measurement to result
• Includes an integrated optical constants database
• Helpful user diagnostics keep you informed
• Streamlines workflows to save time
This is a must for Good Manufacturing Practices and other regulatory requirements. Therefore the LS 13 320 XR analyzer supports GMP with specific tools for Installation Qualification (IQ) and Operational Qualification (OQ).
- Expanded dynamic range: 10 nm – 3,500 μm
- Real data down to 10 nm
- Streamlined processes and compresses workflows
- Intuitive software interface for results in three clicks or less
- Smaller footprint
ApplicationsThe LS 13 320 XR can be used for many different applications:
LS 13 320 XR – Pigment Sizing Application Note
LS 13 320 – Soil Granulometry Application Note
LS 13 320 XR – Particle Size Analysis Application Note