Beckman Coulter
Multisizer 4e

Spot Small Differences

• Expanded measurement range: 10 nm – 3,500 µm
• Laser diffraction plus advanced Polarization Intensity Differential Scattering (PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm
• Provides accurate, reliable detection of multiple particle sizes in a single sample

Easy-to-use Software

• ADAPT Software features automatic pass/fail check
• Pre-configured methods deliver results with 3 clicks or less
• Simplifies analyzer operation by experts & novice users alike
• 1-click overlay with historical data
• Intuitive user diagnostics keep you informed during sampling
• Simplified method creation for standardized measurements

ADAPT Software enables 21 CFR Part 11

• Customizable security system to meet diverse needs
• Choose from 4 security levels
• High-security configuration supports 21 CFR Part 11

PIDS Technology* for Direct Detection of 10 nm Particles

• 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
• Analyser measures scattered light from samples over a range of angles
• Differences between horizontally & vertically radiated light for each wavelength yield high-resolution particle size distribution data

Dry Powder System

Analytical size range: 400 nm – 3,500 µm

• Measures entire sample as required by the ISO 13 320 Standard
• Programmable Obscuration setting to optimize sample feed rate
• User-selectable vacuum pressure for maximum dispersion control

Universal Liquid Module

Analytical size range: 10 nm – 2,000 µm

• Fully automatic with auto-dilution, auto-filling and auto-rinsing
• Analyses samples suspended in aqueous as well as non-aqueous diluents for maximum flexibility
• Wetted materials list: Teflon®, 316 Stainless Steel, Glass, Kal-rez® and PEEK

Sonicator Control Unit

• Needle probe sonicator for additional dispersion control of wet samples
• Fully adjustable power settings
• In-situ sonication with ULM before/during the run, can also be operated external to module

EU Vacuum Cleaner

• Vacuum pressure range fully adjustable
• Integrated vacuum control unit for optimised vacuum/obscuration settings
• Two vacuum systems to choose from

The LS 13 320 XR particle size analyzer uses advanced laser diffraction and PIDS technology for the sizing of non-spherical, sub-micron particles. Initially, particle sizing by laser diffraction was limited to the use of the Fraunhofer diffraction theory. Laser diffraction offers a number of advantages – laser diffraction analyzers go beyond simple diffraction effects. General approaches are now based on the Mie theory and the measurement of scattering intensity over a wide scattering angular range is employed.

Using PIDS Technology

Pioneered by Beckman Coulter, most laser diffraction manufacturers use the above two approaches, i.e., wide angular detecting range and short wavelength, to size small particles. However, sizing even smaller particles (tens of nanometers in diameter), cannot be achieved using only these two approaches. Any further increase in scattering angle will not yield any significant improvement due to the everslower angular variation. Figure 2 is a 3-D display that illustrates the very slow angular variation for small particles. For particles smaller than 200 nm, even by taking advantage of the above two approaches, it is still difficult to obtain an accurate size.

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