Lattice GO
AMI Instruments
Lattice GO
X-Ray Diffractometer
- Compact lightweight XRD for easy portability
- Delivers precise results within a few minutes
- Analyse anywhere / Wide-angle goniometer (0°-130°/ -3°-156°)
The Lattice GO redefines portable X-ray diffraction, delivering laboratory-grade performance in a compact, lightweight system. Designed for versatility, it integrates a specialized X-ray source, Bragg-Brentano diffraction geometry, and an advanced 2D array detector to generate high-quality XRD spectra in minutes.
Optimised for field research, on-site quality control, and space-constrained laboratories, the Lattice GO provides high-intensity data with exceptional angular precision, rivaling traditional benchtop systems. Its rugged construction, rapid scanning capability, and user-friendly operation ensure reliable results in any environment.
With the Lattice GO, high-resolution diffraction is no longer confined to the lab—bringing powerful material analysis wherever it’s needed.
-
Key Features
Compact and Portable Design
A lightweight, space-efficient system suitable for benchtop use or field deployment, making it ideal for laboratories with limited space or on-site analysis.
Rapid, In-Situ XRD Analysis
Enables immediate diffraction measurements following material synthesis, facilitating real-time screening and informed decision-making.
Laboratory-Grade Data Quality
Delivers high-intensity diffraction patterns with angular precision comparable to full-scale laboratory diffractometers.
Bragg-Brentano Diffraction Geometry
A proven configuration for accurate and reproducible powder diffraction analysis, ensuring high data reliability.
Advanced X-ray Source
Optimised for enhanced signal stability and consistent performance across diverse sample types.
High-Resolution 2D Array Detector
Provides rapid data acquisition with broad angular coverage, capturing high-fidelity diffraction patterns with excellent signal-to-noise ratio.
Optimised Analytical Workflow
Enables efficient sample pre-screening, reducing the need for external testing and improving overall analytical throughput.
-
Applications
Mineral Industry:
The Lattice GO portable X-ray diffractometer is becoming an essential tool for geological exploration teams, providing rapid, reliable analysis directly in the field. Its ability to perform real-time phase identification and quantitative analysis empowers geologists to make faster, more informed decisions.
• On-Site Mineral Analysis
Qualitative and quantitative identification of mineral phases to support mineralogical research and exploration.
• Geological Feature Evaluation
Analyze surrounding rock structures in mineralization zones to understand ore genesis and mineral distribution.
• Process Optimization
Identify ore formation mechanisms and determine appropriate mining, beneficiation, refining, and smelting methods.
• Core Logging Support
Detect fine-grained fragments, complex lithologies, and subtle mineral changes to guide drilling and stratigraphic interpretation.
• Rapid Ore Quality Assessment
Conduct fast, quantitative mineral content analysis on-site to inform mineral trading and field decisions.
• Urban Resource Recovery
Identify and quantify mineral content from recycled materials for effective urban mining and resource reuse.
Sandstone Sample Diffraction Pattern and Standard-Free Quantitative Analysis
Zinc Concentrate Diffraction Pattern and Qualitative Analysis
Cultural Heritage:
The Lattice GO enables non-destructive, on-site analysis of culturally significant materials, making it an invaluable tool for conservation scientists, archaeologists, and museums. Its precision and portability support preservation, research, and authentication of priceless artifacts.
• Phase Analysis of Artifact Materials
Identify crystalline phases in bronzeware, ironware, ceramics, pigments, and mural base layers.
• Corrosion and Weathering Studies
Analyze corrosion products and weathering layers to understand degradation mechanisms and guide conservation strategies.
• Restoration and Preservation
Assist in development of preservation techniques for murals, stone relics, and metal artifacts through material characterization.
• Provenance Studies
Determine the geographic origin and production techniques of cultural relics using mineralogical fingerprinting.
• Authentication and Anti-Counterfeiting
Verify authenticity of artifacts by comparing structural signatures to known references.
Ancient Ceramic Fragment Diffraction Data and Qualitative Analysis
Security and Drug Safety:
The Lattice GO brings advanced, non-destructive XRD capabilities to law enforcement and forensic science, enabling rapid, on-site analysis with minimal sample preparation. Delivering real-time results, it supports fast, accurate decision-making in critical situations.
On-Site Drug Identification
Perform rapid, non-destructive qualitative and quantitative phase analysis of narcotics, new psychoactive substances (NPS), and precursor materials.
Criminal Investigation Support
Identify and characterize controlled substances in the field to aid forensic investigations and track drug trafficking routes and sources.
Non-Destructive Forensic Testing
Preserve sample integrity while obtaining precise, high-resolution diffraction data for reliable forensic analysis.
Drug and Substance Characterization
Conduct on-site qualitative and quantitative analysis of illicit drugs, counterfeit pharmaceuticals, and precursor materials for trafficking detection and source attribution.
Trace Evidence Analysis
Detect and classify trace compounds such as cyanide, organic contaminants, paper fillers, toxic additives, and soil or mineral fragments from crime scenes or stolen cultural relics.
Security Screening at High-Risk Locations
Rapidly identify illicit substances, explosives, and hazardous materials at border checkpoints, airports, train stations, and public venues.
Explosives and Contaminant Detection
Analyze explosive compounds and their decomposition residues, as well as adulterants such as talcum powder and borax in consumer goods and food products.
Heroin Hydrochloride XRD Pattern
-
Specifications
Lattice Portable-X Portable XRD Analyzer X-Ray Tube Power 30 W, 30 kV / 1 mA X-Ray Tube Target Material Cu Goniometer Theta / 2-theta geometry, radius 110 mm Detector Photon direct-read two-dimensional array detector Maximum Scanning Range 0° – 130° 2-Theta Minimum Step Size ±0.01° Measurement Speed Two speeds available: 6°/min and 12°/min Battery Runtime 3 hours Volume & Weight L 4.8 in (120 mm) × W 11.9 in (300 mm) × H 11.9 in (300 mm), 26.5 lbs (12 kg) 
Ruby Standard Sample (NIST1976) 
Silicon Powder Measurement Data and Rietveld Structure Refinement
